Publication:

The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology

Date

2023

Proceedings Paper

https://doi.org/10.1109/IRPS48203.2023.10118026

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Author(s)

Sangani, Dishant

;

Diaz Fortuny, Javier

;

;

;

Gielen, Georges

Journal

N/A

Metrics

799 since deposited on 2023-07-15

1last month

Acq. date: 2026-01-09