Publication:

IP Session on Chiplet: Design, Assembly, and Test

Date

2023
Proceedings Paper
https://doi.org/10.1109/vts56346.2023.10140103
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Published version 1.51 MB

Author(s)

Vinnakota, Bapi
;
Derakhshandeh, Jaber  
;
Beyne, Eric  
;
Marinissen, Erik Jan  
;
Chakravarty, Sreejit

Journal

IEEE VLSI Test Symposium

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