Publication:

Optimization of Retention in Ferroelectricity Boosted Gate Stacks for 3D NAND

Date

2023
Proceedings Paper
https://doi.org/10.1109/IMW56887.2023.10145986
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Author(s)

Breuil, Laurent  
;
Popovici, Mihaela Ioana  
;
Stiers, Jimmy  
;
Arreghini, Antonio  
;
Ramesh, Siva  
;
Van den Bosch, Geert  
;
Van Houdt, Jan  
;
Rosmeulen, Maarten  

Journal

N/A

Abstract

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Acq. date: 2026-04-29

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