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A simple and accurate deep submicron mismatch model

dc.contributor.authorCroon, Jeroen
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorSansen, Willy
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-14T12:46:05Z
dc.date.available2021-10-14T12:46:05Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4224
dc.sourceIIOimport
dc.titleA simple and accurate deep submicron mismatch model
dc.typeProceedings paper
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage356
dc.source.endpage359
dc.source.conferenceProceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2000
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - open access


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