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3D backside integration of FinFETs: Is there an impact on LF noise?
Publication:
3D backside integration of FinFETs: Is there an impact on LF noise?
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Date
2023
Journal article
https://doi.org/10.1016/j.sse.2023.108724
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Jourdain, Anne
;
Claeys, Cor
;
Veloso, Anabela
Journal
SOLID-STATE ELECTRONICS
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920
since deposited on 2023-09-10
1
last month
Acq. date: 2026-01-07
Citations
Metrics
Views
920
since deposited on 2023-09-10
1
last month
Acq. date: 2026-01-07
Citations