Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
SMART: Selective MAC zero-optimization for neural network reliability under radiation
View/
open
Published version (1.079Mb)
Metadata
Show full item record
Authors
Justus Rajappa, Anuj
;
Reiter, Phil
;
Sartori, Tarso Kraemer Sarzi
;
Laurini, Luiz Henrique
;
Fourati, Hassen
;
Mercelis, Siegfried
;
Famaey, Jeroen
;
Bastos, Rodrigo Possamai
DOI
10.1016/j.microrel.2023.115092
ISSN
0026-2714
Issue
November
Journal
MICROELECTRONICS RELIABILITY
Volume
150
Research discipline
Computer science/information technology
Title
SMART: Selective MAC zero-optimization for neural network reliability under radiation
Publication type
Journal article
Embargo date
2023-11-30
Collections
Articles
Version history
Version
Item
Date
Summary
3
20.500.12860/43238.3
*
2024-03-18T13:16:10Z
validation by library/open access desk
2
20.500.12860/43238.2
2024-01-04T15:29:47Z
validation by DUCS coordinator
1
20.500.12860/43238
2023-12-08T17:19:25Z
*Selected version
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login