SMART: Selective MAC zero-optimization for neural network reliability under radiation

Justus Rajappa, Anuj; Reiter, Phil; Sartori, Tarso Kraemer Sarzi; Laurini, Luiz Henrique; Fourati, Hassen; Mercelis, Siegfried; Famaey, Jeroen; Bastos, Rodrigo Possamai

doi:10.1016/j.microrel.2023.115092

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SMART: Selective MAC zero-optimization for neural network reliability under radiation

Date

2023

Journal article

https://doi.org/10.1016/j.microrel.2023.115092

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Justus Rajappa, Anuj

;

Reiter, Phil

;

Sartori, Tarso Kraemer Sarzi

;

Laurini, Luiz Henrique

;

Fourati, Hassen

;

Mercelis, Siegfried

;

Famaey, Jeroen

;

Bastos, Rodrigo Possamai

Journal

MICROELECTRONICS RELIABILITY

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877 since deposited on 2023-12-08

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SMART: Selective MAC zero-optimization for neural network reliability under radiation

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