Publication:

SMART: Selective MAC zero-optimization for neural network reliability under radiation

Date

2023
Journal article
https://doi.org/10.1016/j.microrel.2023.115092
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dc.contributor.authorJustus Rajappa, Anuj
dc.contributor.authorReiter, Phil
dc.contributor.authorSartori, Tarso Kraemer Sarzi
dc.contributor.authorLaurini, Luiz Henrique
dc.contributor.authorFourati, Hassen
dc.contributor.authorMercelis, Siegfried
dc.contributor.authorFamaey, Jeroen
dc.contributor.authorBastos, Rodrigo Possamai
dc.contributor.imecauthorMercelis, Siegfried
dc.contributor.imecauthorJustus Rajappa, Anuj
dc.contributor.imecauthorReiter, Phil
dc.contributor.imecauthorFamaey, Jeroen
dc.contributor.orcidimecMercelis, Siegfried::0000-0001-9355-6566
dc.contributor.orcidimecJustus Rajappa, Anuj::0000-0001-8167-9171
dc.contributor.orcidimecReiter, Phil::0000-0002-2548-7172
dc.contributor.orcidimecFamaey, Jeroen::0000-0002-3587-1354
dc.date.accessioned2024-03-18T13:20:16Z
dc.date.available2023-12-08T17:19:25Z
dc.date.available2024-01-04T15:46:45Z
dc.date.available2024-03-18T13:20:16Z
dc.date.embargo2023-11-30
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by : the MultiRad project of the Region Auvergne-Rhpne-Alpes's international ambition pack (PAI), France; the French national research agency, France within the France-2030 program (ANR-15-IDEX-0002) ; the LabEx PERSYVAL-Lab (ANR-11-LABX-0025-01) ; the IRT Nanoelec (ANR-10-AIRT-0005) of the French national program PIA ("Programme d'Investissements d'Avenir) ; the LPSC's GENESIS platform; Bourse de mobilite Generation IA 2030, funded by the French embassy in Belgium; and MOVIQ (Mastering Onboard Vision Intelligence and Quality) project funded by Flanders Innovation & Entrepreneurship (VLAIO), Belgium and Flanders Space (VRI) , Belgium.
dc.identifier.doi10.1016/j.microrel.2023.115092
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43238
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage115092
dc.source.endpageN/A
dc.source.issueNovember
dc.source.journalMICROELECTRONICS RELIABILITY
dc.source.numberofpages7
dc.source.volume150
dc.subject.disciplineComputer science/information technology
dc.subject.keywordsIMPACT
dc.subject.keywordsPRECISION
dc.subject.keywordsEDGE
dc.title

SMART: Selective MAC zero-optimization for neural network reliability under radiation

dc.typeJournal article
dspace.entity.typePublication
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