Publication:

SMART: Selective MAC zero-optimization for neural network reliability under radiation

Date

2023
Journal article
https://doi.org/10.1016/j.microrel.2023.115092
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 1.08 MB

Author(s)

Justus Rajappa, Anuj  
;
Reiter, Phil  
;
Sartori, Tarso Kraemer Sarzi
;
Laurini, Luiz Henrique
;
Fourati, Hassen
;
Mercelis, Siegfried  
;
Famaey, Jeroen  
;
Bastos, Rodrigo Possamai

Journal

MICROELECTRONICS RELIABILITY

Abstract

Description

Statistics

Downloads

318 since deposited on 2023-12-08
22last month
3last week
Acq. date: 2026-08-09

Views

882 since deposited on 2023-12-08
5last month
2last week
Acq. date: 2026-08-09

Citations

Statistics

Downloads

318 since deposited on 2023-12-08
22last month
3last week
Acq. date: 2026-08-09

Views

882 since deposited on 2023-12-08
5last month
2last week
Acq. date: 2026-08-09

Citations