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SMART: Selective MAC zero-optimization for neural network reliability under radiation
Publication:
SMART: Selective MAC zero-optimization for neural network reliability under radiation
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Date
2023
Journal article
https://doi.org/10.1016/j.microrel.2023.115092
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Justus Rajappa, Anuj
;
Reiter, Phil
;
Sartori, Tarso Kraemer Sarzi
;
Laurini, Luiz Henrique
;
Fourati, Hassen
;
Mercelis, Siegfried
;
Famaey, Jeroen
;
Bastos, Rodrigo Possamai
Journal
MICROELECTRONICS RELIABILITY
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172
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since deposited on 2023-12-08
Acq. date: 2025-12-16
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Downloads
172
since deposited on 2023-12-08
27
last month
5
last week
Acq. date: 2025-12-16
Views
875
since deposited on 2023-12-08
Acq. date: 2025-12-16
Citations