Publication:

SMART: Selective MAC zero-optimization for neural network reliability under radiation

Date

2023
Journal article
https://doi.org/10.1016/j.microrel.2023.115092
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Author(s)

Justus Rajappa, Anuj  
;
Reiter, Phil  
;
Sartori, Tarso Kraemer Sarzi
;
Laurini, Luiz Henrique
;
Fourati, Hassen
;
Mercelis, Siegfried  
;
Famaey, Jeroen  
;
Bastos, Rodrigo Possamai

Journal

MICROELECTRONICS RELIABILITY

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290 since deposited on 2023-12-08
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