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Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency
Publication:
Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency
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Date
2023
Proceedings Paper
https://doi.org/10.1109/ITC-Asia58802.2023.10301169
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chuang, Po-Yao
;
Lorenzelli, Francesco
;
Marinissen, Erik Jan
Journal
N/A
Abstract
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807
since deposited on 2023-12-14
Acq. date: 2026-02-27
Citations
Statistics
Views
807
since deposited on 2023-12-14
Acq. date: 2026-02-27
Citations