A Condensed History Approach to X-Ray Dark Field Effects in Edge Illumination Phase Contrast Simulations

Abstract

X-ray dark field signals, measurable in many x-ray phase contrast imaging (XPCI) setups, stem from unresolvable microstructures in the scanned sample. This makes them ideally suited for the detection of certain pathologies, which correlate with changes in the microstructure of a sample. Simulations of x-ray dark field signals can aid in the design and optimization of XPCI setups, and the development of new reconstruction techniques. Current simulation tools, however, require explicit modelling of the sample microstructures according to their size and spatial distribution. This process is cumbersome, does not translate well between different samples, and considerably slows down simulations. In this work, a condensed history approach to modelling x-ray dark field effects is presented, under the assumption of an isotropic distribution of microstructures, and applied to edge illumination phase contrast simulations. It substantially simplifies the sample model, can be easily ported between samples, and is two orders of magnitude faster than conventional dark field simulations, while showing equivalent results.