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A Condensed History Approach to X-Ray Dark Field Effects in Edge Illumination Phase Contrast Simulations
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Authors
Francken, Nicholas
;
Sanctorum, Jonathan
;
Renders, Jens
;
Paramonov, Pavel
;
Sijbers, Jan
;
De Beenhouwer, Jan
DOI
10.1109/EMBC40787.2023.10340826
EISBN
979-8-3503-2447-1
ISSN
1557-170X
PMID
MEDLINE:38083284
Conference
45th Annual International Conference of the IEEE-Engineering-in-Medicine-and-Biology-Society (EMBC)
Journal
N/A
Title
A Condensed History Approach to X-Ray Dark Field Effects in Edge Illumination Phase Contrast Simulations
Publication type
Proceedings paper
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2
20.500.12860/43591.2
*
2024-03-25T16:00:41Z
validation by library/open access desk
1
20.500.12860/43591
2024-02-25T18:23:26Z
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