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Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology

dc.contributor.authorGao, Zhan
dc.contributor.authorHu, Min-Chun
dc.contributor.authorBaert, Rogier
dc.contributor.authorChehab, Bilal
dc.contributor.authorSwenton, Joe
dc.contributor.authorMalagi, Santosh
dc.contributor.authorHuisken, Jos
dc.contributor.authorGoossens, Kees
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2024-08-06T09:57:11Z
dc.date.available2024-03-18T18:17:33Z
dc.date.available2024-08-06T09:57:11Z
dc.date.issued2024
dc.identifier.issn2168-2356
dc.identifier.otherWOS:001168621300001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43701.2
dc.sourceWOS
dc.titleCell-Aware Test on Various Circuits in an Advanced 3-nm Technology
dc.typeJournal article
dc.contributor.imecauthorGao, Zhan
dc.contributor.imecauthorHu, Min-Chun
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorChehab, Bilal
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.identifier.doi10.1109/MDAT.2023.3294872
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.beginpage56
dc.source.endpage64
dc.source.journalIEEE DESIGN & TEST
dc.source.issue2
dc.source.volume41
imec.availabilityPublished - imec
dc.description.wosFundingTextNo Statement Available


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220.500.12860/43701.2*2024-08-06T09:55:15Zvalidation by library/open access desk
120.500.12860/437012024-03-18T18:17:33Z

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