Publication:

Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology

Date

2024

Journal article

https://doi.org/10.1109/MDAT.2023.3294872

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Author(s)

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Malagi, Santosh

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Marinissen, Erik Jan

Journal

IEEE DESIGN & TEST

Metrics

695 since deposited on 2024-03-18

Acq. date: 2025-12-12