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Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
Publication:
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
Date
2024
Journal article
https://doi.org/10.1109/MDAT.2023.3294872
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gao, Zhan
;
Hu, Min-Chun
;
Baert, Rogier
;
Chehab, Bilal
;
Swenton, Joe
;
Malagi, Santosh
;
Huisken, Jos
;
Goossens, Kees
;
Marinissen, Erik Jan
Journal
IEEE DESIGN & TEST
Abstract
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Views
692
since deposited on 2024-03-18
Acq. date: 2025-10-23
Citations
Metrics
Views
692
since deposited on 2024-03-18
Acq. date: 2025-10-23
Citations