Publication:
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
| dc.contributor.author | Gao, Zhan | |
| dc.contributor.author | Hu, Min-Chun | |
| dc.contributor.author | Baert, Rogier | |
| dc.contributor.author | Chehab, Bilal | |
| dc.contributor.author | Swenton, Joe | |
| dc.contributor.author | Malagi, Santosh | |
| dc.contributor.author | Huisken, Jos | |
| dc.contributor.author | Goossens, Kees | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Gao, Zhan | |
| dc.contributor.imecauthor | Hu, Min-Chun | |
| dc.contributor.imecauthor | Baert, Rogier | |
| dc.contributor.imecauthor | Chehab, Bilal | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2024-08-06T09:57:11Z | |
| dc.date.available | 2024-03-18T18:17:33Z | |
| dc.date.available | 2024-08-06T09:57:11Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | No Statement Available | |
| dc.identifier.doi | 10.1109/MDAT.2023.3294872 | |
| dc.identifier.issn | 2168-2356 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43701 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 56 | |
| dc.source.endpage | 64 | |
| dc.source.issue | 2 | |
| dc.source.journal | IEEE DESIGN & TEST | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 41 | |
| dc.title | Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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