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Articles
Impact of Sub-µm Wafer Thinning on Latch-Up Risk in DTCO/STCO Scaling Era
Publication:
Impact of Sub-µm Wafer Thinning on Latch-Up Risk in DTCO/STCO Scaling Era
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Date
2024
Journal article
https://doi.org/10.1109/TED.2024.3367315
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Serbulova, Kateryna
;
Chen, Shih-Hung
;
Hellings, Geert
;
Veloso, Anabela
;
Jourdain, Anne
;
De Boeck, Jo
;
Groeseneken, Guido
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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601
since deposited on 2024-03-25
Acq. date: 2026-01-09
Citations
Metrics
Views
601
since deposited on 2024-03-25
Acq. date: 2026-01-09
Citations