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Advanced EUV patterning of 2D TMDs for CMOS integration
Publication:
Advanced EUV patterning of 2D TMDs for CMOS integration
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Date
2024
Proceedings Paper
https://doi.org/10.1117/12.3011818
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Faramarzi, Vina
;
de Poortere, Etienne
;
Venugopalan, Syam Parayil
;
Woltgens, Pieter
;
Woo, Youngtag
;
van de Kerkhof, Mark
;
Kumar, Pawan
;
Medina Silva, Henry
;
Morin, Pierre
;
Asselberghs, Inge
;
Dorow, Chelsey
;
O'Brien, Kevin
;
Maxey, Kirby
;
Avci, Uygar
Journal
Proceedings of SPIE
Abstract
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Downloads
329
since deposited on 2024-06-06
17
last month
4
last week
Acq. date: 2026-01-07
Views
692
since deposited on 2024-06-06
5
last month
2
last week
Acq. date: 2026-01-06
Citations