Publication:

Unveiling the Vulnerability of Oxide-Breakdown-Based PUF

Date

2024

Journal article

https://doi.org/10.1109/LED.2024.3369860

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Author(s)

Saraza Canflanca, Pablo

;

;

Diaz Fortuny, Javier

;

;

Degraeve, Robin

;

;

Verbauwhede, I.

;

Journal

IEEE ELECTRON DEVICE LETTERS

Metrics

599 since deposited on 2024-06-08

3last month

Acq. date: 2025-12-12