dc.contributor.author | Alkoken, Ran | |
dc.contributor.author | Baram, Mor | |
dc.contributor.author | Oron, Gadi | |
dc.contributor.author | Schuch, Nivea | |
dc.contributor.author | Robert, Frederic | |
dc.contributor.author | Figueiro, Thiago | |
dc.contributor.author | Brand, Omri | |
dc.contributor.author | Geta, Matan | |
dc.contributor.author | Saha, Kasturi | |
dc.contributor.author | Miller, Elias | |
dc.contributor.author | Zavhon, Tal | |
dc.contributor.author | Tiwari, Dipayan | |
dc.contributor.author | Singh, Deepakkumar | |
dc.contributor.author | Sarkar, Sujan Kumar | |
dc.contributor.author | Rincon Delgadillo, Paulina | |
dc.contributor.author | Lorusso, Gian | |
dc.contributor.author | Beral, Christophe | |
dc.contributor.author | Wei, Chih-I | |
dc.contributor.author | Curvacho, Gabriel | |
dc.contributor.author | Kim, Young Chang | |
dc.contributor.author | Fenger, Germain | |
dc.date.accessioned | 2024-08-26T08:42:39Z | |
dc.date.available | 2024-06-15T17:25:53Z | |
dc.date.available | 2024-08-26T08:42:39Z | |
dc.date.issued | 2024 | |
dc.identifier.isbn | 978-1-5106-7216-1 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:001224296200031 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44048.2 | |
dc.source | WOS | |
dc.title | Low Landing Energy as an Enabler for Optimal Contour Based OPC Modeling in the EUV Era | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Sarkar, Sujan Kumar | |
dc.contributor.imecauthor | Lorusso, Gian | |
dc.contributor.imecauthor | Beral, Christophe | |
dc.contributor.imecauthor | Rincon Delgadillo, Paulina | |
dc.contributor.orcidimec | Sarkar, Sujan Kumar::0000-0002-8471-6297 | |
dc.contributor.orcidimec | Lorusso, Gian::0000-0003-3498-5082 | |
dc.contributor.orcidimec | Beral, Christophe::0000-0003-1356-9186 | |
dc.date.embargo | 2024-04-09 | |
dc.identifier.doi | 10.1117/12.3010898 | |
dc.identifier.eisbn | 978-1-5106-7217-8 | |
dc.source.numberofpages | 14 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 1295516 | |
dc.source.conference | Conference on Metrology, Inspection, and Process Control XXXVIII | |
dc.source.conferencedate | FEB 26-29, 2024 | |
dc.source.conferencelocation | San Jose | |
dc.source.journal | Proceedings of SPIE | |
dc.source.volume | 12955 | |
imec.availability | Published - open access | |