dc.contributor.author | Schelcher, Guillaume | |
dc.contributor.author | Athayde, Marsil | |
dc.contributor.author | Schoofs, Stijn | |
dc.contributor.author | Hsia, Jeff | |
dc.contributor.author | Khalik, Zuan | |
dc.contributor.author | Li, Fahong | |
dc.contributor.author | Nechaev, Konstantin | |
dc.contributor.author | Sahraeian, Reza | |
dc.contributor.author | Tamaddon, Amir-Hossein | |
dc.contributor.author | Blanco, Victor | |
dc.contributor.author | van der Sanden, Stefan | |
dc.contributor.author | Zhang, Yichen | |
dc.contributor.author | Anunciado, Roy | |
dc.contributor.author | Dillen, Harm | |
dc.contributor.author | Leray, Philippe | |
dc.date.accessioned | 2024-08-26T10:21:49Z | |
dc.date.available | 2024-06-15T17:25:55Z | |
dc.date.available | 2024-08-26T10:21:49Z | |
dc.date.issued | 2024 | |
dc.identifier.isbn | 978-1-5106-7216-1 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.other | WOS:001224296200017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44056.2 | |
dc.source | WOS | |
dc.title | Feature grouping to enable edge placement error-aware process control in multi-feature logic use case | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Schelcher, Guillaume | |
dc.contributor.imecauthor | Schoofs, Stijn | |
dc.contributor.imecauthor | Tamaddon, Amir-Hossein | |
dc.contributor.imecauthor | Blanco, Victor | |
dc.contributor.imecauthor | Leray, Philippe | |
dc.contributor.orcidimec | Schelcher, Guillaume::0000-0003-3383-1049 | |
dc.contributor.orcidimec | Tamaddon, Amir-Hossein::0000-0003-4566-0697 | |
dc.contributor.orcidimec | Blanco, Victor::0000-0003-4308-0381 | |
dc.contributor.orcidimec | Leray, Philippe::0000-0002-1086-270X | |
dc.date.embargo | 2024-09-08 | |
dc.identifier.doi | 10.1117/12.3010421 | |
dc.identifier.eisbn | 978-1-5106-7217-8 | |
dc.source.numberofpages | 11 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 129550O | |
dc.source.conference | Conference on Metrology, Inspection, and Process Control XXXVIII | |
dc.source.conferencedate | FEB 26-29, 2024 | |
dc.source.conferencelocation | San Jose | |
dc.source.journal | Proceedings of SPIE | |
dc.source.volume | 12955 | |
imec.availability | Published - imec | |