Publication:
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage
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Acq. date: 2026-08-08
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Downloads
165 since deposited on 2024-07-04
11last month
3last week
Acq. date: 2026-08-08
Views
633 since deposited on 2024-07-04
Acq. date: 2026-08-08
Citations