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De-coupling Thermo-migration from Electromigration using a dedicated test structure
Publication:
De-coupling Thermo-migration from Electromigration using a dedicated test structure
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Date
2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529380
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Varela Pedreira, Olalla
;
Ding, Youqi
;
Coenen, David
;
Roussel, Philippe
;
Saleh, Ahmed
;
Simons, Veerle
;
Zahedmanesh, Houman
;
Ciofi, Ivan
;
Croes, Kristof
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425
since deposited on 2024-08-16
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Acq. date: 2026-01-07
Citations
Metrics
Views
425
since deposited on 2024-08-16
2
last month
Acq. date: 2026-01-07
Citations