Publication:
Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate
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503 since deposited on 2024-08-16
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Acq. date: 2025-12-15
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503 since deposited on 2024-08-16
1last month
1last week
Acq. date: 2025-12-15
Citations