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Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors
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Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors
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Date
2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529439
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Musibau, Solomon
;
Poumpouridis, N.
;
Tsiara, Artemisia
;
Franco, Jacopo
;
Berciano, Mathias
;
Van Campenhout, Joris
;
De Wolf, Ingrid
;
Croes, Kristof
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426
since deposited on 2024-08-16
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Acq. date: 2026-01-07
Citations
Metrics
Views
426
since deposited on 2024-08-16
3
last month
Acq. date: 2026-01-07
Citations