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Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance

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432 since deposited on 2024-08-16
1last month
Acq. date: 2026-04-26

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432 since deposited on 2024-08-16
1last month
Acq. date: 2026-04-26

Citations