Publication:

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy

Date

2024
Journal article
https://doi.org/10.1016/j.mne.2024.100247
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 2.81 MB

Author(s)

Lagrain, Pieter  
;
Paulussen, Kris  
;
Grieten, Eva  
;
Van den Bosch, Geert  
;
Rachidi, Sana  
;
Yudistira, Didit  
;
Wouters, Lennaert  
;
Hantschel, Thomas  

Journal

MICRO AND NANO ENGINEERING

Abstract

Description

Statistics

Downloads

142 since deposited on 2024-08-17
6last month
5last week
Acq. date: 2026-07-16

Views

128 since deposited on 2024-08-17
Acq. date: 2026-07-16

Citations

Statistics

Downloads

142 since deposited on 2024-08-17
6last month
5last week
Acq. date: 2026-07-16

Views

128 since deposited on 2024-08-17
Acq. date: 2026-07-16

Citations