Publication:

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy

Date

2024
Journal article
https://doi.org/10.1016/j.mne.2024.100247
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Author(s)

Lagrain, Pieter  
;
Paulussen, Kris  
;
Grieten, Eva  
;
Van den Bosch, Geert  
;
Rachidi, Sana  
;
Yudistira, Didit  
;
Wouters, Lennaert  
;
Hantschel, Thomas  

Journal

MICRO AND NANO ENGINEERING

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132 since deposited on 2024-08-17
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Acq. date: 2026-05-17

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