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Silent Data Corruption: Test or Reliability Problem?

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorDixit, Harish Dattatraya
dc.contributor.authorBlanton, Shawn
dc.contributor.authorKuo, Aaron
dc.contributor.authorLi, Wei
dc.contributor.authorMitra, Subhashish
dc.contributor.authorNigh, Chris
dc.contributor.authorPurdy, Ruben
dc.contributor.authorKaczer, Ben
dc.contributor.authorSanganil, Dishant
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGielen, Georges
dc.date.accessioned2025-07-10T09:45:52Z
dc.date.available2024-08-23T17:30:06Z
dc.date.available2025-07-10T09:45:52Z
dc.date.issued2024
dc.identifier.isbn979-8-3503-4933-7
dc.identifier.issn1530-1877
dc.identifier.otherWOS:001260970400044
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44361.2
dc.sourceWOS
dc.titleSilent Data Corruption: Test or Reliability Problem?
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.identifier.doi10.1109/ETS61313.2024.10567773
dc.identifier.eisbn979-8-3503-4932-0
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conferenceIEEE European Test Symposium (ETS)
dc.source.conferencedateMAY 20-24, 2024
dc.source.conferencelocationHague
dc.source.journalN/A
imec.availabilityPublished - imec


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220.500.12860/44361.2*2025-07-10T09:43:37Zvalidation by library/open access desk
120.500.12860/443612024-08-23T17:30:06Z

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