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Silent Data Corruption: Test or Reliability Problem?
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Authors
Marinissen, Erik Jan
;
Dixit, Harish Dattatraya
;
Blanton, Shawn
;
Kuo, Aaron
;
Li, Wei
;
Mitra, Subhashish
;
Nigh, Chris
;
Purdy, Ruben
;
Kaczer, Ben
;
Sanganil, Dishant
;
Weckx, Pieter
;
Roussel, Philippe
;
Gielen, Georges
DOI
10.1109/ETS61313.2024.10567773
EISBN
979-8-3503-4932-0
ISBN
979-8-3503-4933-7
ISSN
1530-1877
Conference
IEEE European Test Symposium (ETS)
Journal
N/A
Title
Silent Data Corruption: Test or Reliability Problem?
Publication type
Proceedings paper
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Conference contributions
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Version
Item
Date
Summary
2
20.500.12860/44361.2
*
2025-07-10T09:43:37Z
validation by library/open access desk
1
20.500.12860/44361
2024-08-23T17:30:06Z
*Selected version
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