Publication:

Charge trapping in SiOx/ZrO2 gate dielectric stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1864 since deposited on 2021-10-14
1last month
Acq. date: 2026-03-01

Citations

Statistics

Views

1864 since deposited on 2021-10-14
1last month
Acq. date: 2026-03-01

Citations