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Charge trapping in very thin high-permittivity gate dielectric layers
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Authors
Houssa, Michel
;
Stesmans, Andre
;
Naili, Mohamed
;
Heyns, Marc
Issue
9
Journal
Applied Physics Letters
Volume
77
Title
Charge trapping in very thin high-permittivity gate dielectric layers
Publication type
Journal article
Embargo date
9999-12-31
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