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Study of SiGeAsTe and SiGeAsSe chalcogenide thin films by Raman spectroscopy and understanding of their OTS properties
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Study of SiGeAsTe and SiGeAsSe chalcogenide thin films by Raman spectroscopy and understanding of their OTS properties
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Date
2024
Journal article
https://doi.org/10.1016/j.jnoncrysol.2024.123175
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Keukelier, Jonas
;
Devulder, Wouter
;
Sergeant, Stefanie
;
Nuytten, Thomas
;
Meersschaut, Johan
;
Opsomer, Karl
;
Detavernier, Christophe
Journal
JOURNAL OF NON-CRYSTALLINE SOLIDS
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123
since deposited on 2024-09-04
Acq. date: 2025-12-12
Citations
Metrics
Views
123
since deposited on 2024-09-04
Acq. date: 2025-12-12
Citations