Impact of the Oxide Aperture Width on the Degradation of 845 Nm VCSELs for Silicon Photonics

Zenari, Michele; Buffolo, Matteo; Rampazzo, Fabiana; De Santi, Carlo; Rossi, Francesca; Lazzarini, Laura; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan S.; Baets, Roel; Larsson, Anders; Roelkens, Gunther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo

doi:10.1109/JSTQE.2024.3415674

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Impact of the Oxide Aperture Width on the Degradation of 845 Nm VCSELs for Silicon Photonics

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2025-MAR-APR

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https://doi.org/10.1109/JSTQE.2024.3415674

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Meneghesso, Gaudenzio

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Zanoni, Enrico

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Meneghini, Matteo

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IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS

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391 since deposited on 2024-09-18

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Acq. date: 2026-01-10

Impact of the Oxide Aperture Width on the Degradation of 845 Nm VCSELs for Silicon Photonics

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