Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs

Publication:

2024

Journal article

Author(s)

Cretu, Bogdan

;

Tahiat, Abderrahim

;

;

Simoen, Eddy

IEEE TRANSACTIONS ON ELECTRON DEVICES

253 since deposited on 2024-09-22

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Acq. date: 2026-02-24