Authors

Kenens, Conny; Conard, Thierry; Hellemans, L.; Bertrand, P.; Vandervorst, Wilfried

Conference

Secondary Ion Mass Spectrometry - SIMS XII. Proceedings of the 12th International Conference

Title

Combining TOF-SIMS with XPS to quantify organic surface coverages

Publication type

Proceedings paper

Embargo date

9999-12-31