Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Design consideration for Full Well Capacity and Charge Transfer efficiency of a CCD-in-CMOS imager pixel: TCAD study
Publication:
Design consideration for Full Well Capacity and Charge Transfer efficiency of a CCD-in-CMOS imager pixel: TCAD study
Copy permalink
Date
2024
Proceedings Paper
https://doi.org/10.1117/12.3016675
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mahato, Swaraj
;
Thijs, Steven
Journal
Proceedings of SPIE
Abstract
Description
Metrics
Views
348
since deposited on 2024-11-01
2
last month
Acq. date: 2026-01-07
Citations
Metrics
Views
348
since deposited on 2024-11-01
2
last month
Acq. date: 2026-01-07
Citations