About Rapid Phase-Wrapping in Terahertz Phase Contrast Imaging

Abstract

Terahertz (THz) imaging has emerged as a powerful technique in diverse fields, ranging from medical diagnostics to material characterization. Due to its lower frequency, compared to X-ray-based techniques, THz imaging provides an alternative view into the internal structures of samples composed of low-density materials. Notably, phase contrast imaging is advantageous as it generally exhibits reduced distortion from refraction and reflection losses compared to attenuation contrast. However, in the course of THz phase measurements, a fresh issue arises. Due to the relatively wide beam shape of THz imaging combined with rapid phase wrapping, a new type of artifact emerges, posing a significant hindrance to the accuracy and reliability of the imaging process. This paper explores the intricate interplay between beam shape dynamics and phase-wrapping mechanisms in THz imaging systems, unraveling the source of the artifacts that arise from this phenomenon.