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Simulation of Bulge-Out Mechanism Enabling Sub-0.5 μm Scaling of Hybrid Wafer-to-Wafer Bonding
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Simulation of Bulge-Out Mechanism Enabling Sub-0.5 μm Scaling of Hybrid Wafer-to-Wafer Bonding
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Date
2024
Proceedings Paper
https://doi.org/10.1109/ECTC51529.2024.00310
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Messemaeker, Joke
;
Van Sever, Koen
;
Tsau, Yan Wen
;
Zhang, Boyao
;
Croes, Kristof
;
Beyne, Eric
Journal
N/A
Abstract
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276
since deposited on 2024-12-07
Acq. date: 2025-12-16
Citations
Metrics
Views
276
since deposited on 2024-12-07
Acq. date: 2025-12-16
Citations