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Study of mask error enhancement factor improvement with low-n absorber extreme ultraviolet lithography mask
Publication:
Study of mask error enhancement factor improvement with low-n absorber extreme ultraviolet lithography mask
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Date
2024
Journal article
https://doi.org/10.1117/1.JMM.23.4.044401
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Takahata, Yosuke
;
Kovalevich, Tatiana
;
De Simone, Danilo
;
Tanaka, Yusuke
;
Philipsen, Vicky
Journal
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
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42
since deposited on 2025-01-09
Acq. date: 2025-12-16
Citations
Metrics
Views
42
since deposited on 2025-01-09
Acq. date: 2025-12-16
Citations