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Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations
Publication:
Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations
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Date
2025-MAR 15
Journal article
https://doi.org/10.1016/j.mssp.2024.109247
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Laskar, Md Ashiqur Rahman
;
Chakrabarti, Srijan
;
Ahmed, Sakib
;
Ghoreishi, S. Amir
;
Tummala, Pinakapani
;
Afanas'ev, Valeri
;
Molle, Alessandro
;
Lamperti, Alessio
;
Celano, Umberto
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
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254
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Views
254
since deposited on 2025-01-26
4
last month
Acq. date: 2026-01-07
Citations