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Size effect on Raman measured stress and strain induced phonon shifts in ultra-thin silicon film
Publication:
Size effect on Raman measured stress and strain induced phonon shifts in ultra-thin silicon film
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Date
2025-JAN 13
Journal article
https://doi.org/10.1063/5.0240392
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pashartis, C.
;
van Setten, M. J.
;
Pourtois, G.
Journal
APPLIED PHYSICS LETTERS
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256
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Acq. date: 2026-01-06
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Views
256
since deposited on 2025-01-26
4
last month
2
last week
Acq. date: 2026-01-06
Citations