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Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements
Publication:
Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements
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Date
2025-JAN 31
Journal article
https://doi.org/10.1088/2515-7647/ada902
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Geest, Kobe
;
Lievens, Enes
;
Picavet, Ewout
;
De Buysser, Klaartje
;
Van Thourhout, Dries
;
Beeckman, Jeroen
Journal
JOURNAL OF PHYSICS-PHOTONICS
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238
since deposited on 2025-02-02
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Acq. date: 2026-01-09
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Views
238
since deposited on 2025-02-02
2
last month
Acq. date: 2026-01-09
Citations