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Single wafer cleaning and drying: particle removal via a non-contact, non-damaging megasonic clean followed by a high performance "Rotagoni" dry
Publication:
Single wafer cleaning and drying: particle removal via a non-contact, non-damaging megasonic clean followed by a high performance "Rotagoni" dry
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Date
2000
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lauerhaas, Jeff
;
Mertens, Paul
;
Fyen, Wim
;
Kenis, Karine
;
Meuris, Marc
;
Nicolosi, T.
;
Bran, M.
;
Fraser, B.
;
Franklin, C.
;
Wu, Y.
;
Heyns, Marc
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2066
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last week
Acq. date: 2026-01-08
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Metrics
Views
2066
since deposited on 2021-10-14
4
last month
3
last week
Acq. date: 2026-01-08
Citations