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Conference contributions
Analytical model for dispersion measurement in integrated waveguides using michelson interferometry effects
Publication:
Analytical model for dispersion measurement in integrated waveguides using michelson interferometry effects
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Date
2024
Proceedings Paper
https://doi.org/10.1051/epjconf/202430903006
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yorkel, Isaac
;
Girouard, Peter David
;
Galili, Michael
Journal
EPJ Web of Conferences
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7
since deposited on 2025-02-24
Acq. date: 2026-01-07
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196
since deposited on 2025-02-24
Acq. date: 2026-01-06
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Downloads
7
since deposited on 2025-02-24
Acq. date: 2026-01-07
Views
196
since deposited on 2025-02-24
Acq. date: 2026-01-06
Citations