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Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance
Publication:
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance
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Date
2025
Proceedings Paper
https://doi.org/10.1007/978-3-031-74640-6_36
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dey, Bappaditya
;
Anh Tuan Ngo
;
Sacchi, Sara
;
Blanco, Victor
;
Leray, Philippe
;
Halder, Sandip
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146
since deposited on 2025-04-13
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Acq. date: 2026-01-09
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Metrics
Views
146
since deposited on 2025-04-13
2
last month
Acq. date: 2026-01-09
Citations