Publication:
High-resolution Scanning Spreading Resistance Microscopy (SSRM) for carrier mapping in nanoscale gate‑all‑around (GAA) transistors
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Acq. date: 2026-01-06
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7 since deposited on 2025-05-14
5last month
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Acq. date: 2026-01-06
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118 since deposited on 2025-05-14
1last month
Acq. date: 2026-01-07
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