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Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design
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Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design
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Date
2025-JUN 17
Journal article
https://doi.org/10.1109/TED.2025.3578553
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lorenzelli, Francesco
;
Chen, Kuan-Chu
;
Godfrin, Clement
;
Stucchi, Michele
;
Grill, Alexander
;
Wan, Danny
;
De Greve, Kristiaan
;
Marinissen, Erik Jan
;
Gielen, Georges
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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68
since deposited on 2025-06-28
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last month
Acq. date: 2026-01-10
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Metrics
Views
68
since deposited on 2025-06-28
2
last month
Acq. date: 2026-01-10
Citations