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Suitability of Half-Wavelength Contact Acoustic Microscopy to detect deeply buried voids
Publication:
Suitability of Half-Wavelength Contact Acoustic Microscopy to detect deeply buried voids
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3050820
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van Neer, P. L. M. J.
;
van Willigen, D. M.
;
Horchens, L.
;
Gerritsma, A. M.
;
Bogdanowicz, Janusz
;
Chen, Cong
;
Quesson, B. A. J.
Journal
Proceedings of SPIE
Abstract
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43
since deposited on 2025-07-28
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Acq. date: 2026-01-10
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Views
43
since deposited on 2025-07-28
6
last month
Acq. date: 2026-01-10
Citations