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Using Programmed defect vehicle to understand printability of defect/2D structures and characterize it through EUV process impact
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Using Programmed defect vehicle to understand printability of defect/2D structures and characterize it through EUV process impact
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3052510
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Reddy, Bojja Aditya
;
Baskaran, Balakumar
;
Saib, Mohamed
;
Franke, Joern-Holger
;
Beral, Christophe
;
Pak, Murat
;
Halder, Sandip
;
Dusa, Mircea
Journal
Proceedings of SPIE
Abstract
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52
since deposited on 2025-07-28
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Acq. date: 2026-01-09
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Views
52
since deposited on 2025-07-28
4
last month
Acq. date: 2026-01-09
Citations