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A ViT-Based Approach for Enhanced Defect Classification in Nano-Ridge Engineering Using Multi-Resolution Images
Publication:
A ViT-Based Approach for Enhanced Defect Classification in Nano-Ridge Engineering Using Multi-Resolution Images
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3052289
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dey, Bappaditya
;
Tandecki, Tom
;
Belgharat, Aya
;
Swekis, Peter
;
Alcotte, Reynald
;
Mols, Yves
;
Kunert, Bernardette
;
Halder, Sandip
Journal
Proceedings of SPIE
Abstract
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since deposited on 2025-07-28
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Acq. date: 2026-01-10
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Views
50
since deposited on 2025-07-28
3
last month
Acq. date: 2026-01-10
Citations